Measuring multi-layer thickness and color in-line

The UV/Vis / NIR spectrometer ETA of NXT before AudioDev should be used whenever you need to control coating thicknes of various materials such as packaging, polymers, paint, flat pannel, agricultural glass, solar panels and precision optics. The thickness is presented in a SPC chart and is available for in-line production control. The measurements are performed in transmission and/or reflection.