Smart solutions for elemental analysis

The Jeol ElementEye (JSX-1000S) is a ED-XRF spectrometer, providing easy, quick elemental analysis. The instrument is easy to operate and uses touch panel operation. Swiping the screen makes it possible to switch between displays. Results are displayed real-time. The ElementEye achieves high sensitivity analysis throughout the entire energy range, thanks to the new optical system and the Jeol silicon drift detector. Little or no sample preparation is needed. Some of the wide range of applications are: plating thickness measurement, quantitative analysis of alloys, oxides and filler materials in polymers.